The adsorption site for sulphur in the Rh(100)-c(2 × 2)-S system has been investigated using the normal-incidence standing X-ray wavefield adsorption (NISXW) technique. Two Bragg reflecting planes were used for the measurements, the (200) plane (parallel to the surface) and the (111) plane (inclined 54.7° to the surface). The distance between the S atoms and the surface plane was found to be 1.38±0.05 Å. The adsorption site was determined by triangulation of the distances between the S atoms and the (200) and (111) planes, coupled with comparison of the measured coherent fractions with calculations of the expected values. The results indicate that S adsorbs in the symmetric four-fold hollow site, as found for S adsorption on other fcc(100) surfaces.
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry
Mercer, J. R., Scarel, G., Santoni, A., Cowie, B. C. C., Lewis, D., Robinson, A. W., ... Dhanak, V. R. (1996). Structural study of Rh(100)-c(2 × 2)-S using the normal-incidence standing X-ray wavefield method. Surface Science, 369(1-3), 36 - 44. https://doi.org/10.1016/S0039-6028(96)00899-0