Study of the structure of porous silicon via positron annihilation experiments

M. Biasini, G. Ferro, M.A. Monge, G. Di Francia, V. La Ferrara

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Abstract

We performed two-dimensional angular correlation of the electron-positron annihilation radiation (2D-ACAR) and positron lifetime measurements on a porous Si sample. From the width of the narrow 2D-ACAR component, attributed to the positronium atom, we estimated the average size of the pores to be approx. 2.4 nm and did not find evidence of a preferential propagation of the pores. Moreover, by comparing the 2D-ACAR spectrum with that observed for a pure Si crystal, we isolated a further isotropic component attributable to crystal defects of unknown origin.
Original languageEnglish
Pages (from-to)5961 - 5970
Number of pages10
JournalJournal of Physics Condensed Matter
Volume12
Issue number27
DOIs
Publication statusPublished - 10 Jul 2000

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All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics

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