We performed two-dimensional angular correlation of the electron-positron annihilation radiation (2D-ACAR) and positron lifetime measurements on a porous Si sample. From the width of the narrow 2D-ACAR component, attributed to the positronium atom, we estimated the average size of the pores to be approx. 2.4 nm and did not find evidence of a preferential propagation of the pores. Moreover, by comparing the 2D-ACAR spectrum with that observed for a pure Si crystal, we isolated a further isotropic component attributable to crystal defects of unknown origin.
All Science Journal Classification (ASJC) codes
- Materials Science(all)
- Condensed Matter Physics
Biasini, M., Ferro, G., Monge, M. A., Di Francia, G., & La Ferrara, V. (2000). Study of the structure of porous silicon via positron annihilation experiments. Journal of Physics Condensed Matter, 12(27), 5961 - 5970. https://doi.org/10.1088/0953-8984/12/27/314