The structure of (√3 × √3)R30○-sulphur on Rh(111) surface studied by X-ray standing wavefield absorption and surface EXAFS

A. Santoni, B.C.C. Cowie, G. Scarel, V.R. Dhanak

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The surface structure of (√3 × √3)R30°-S-Rh(111) has been investigated by normal incidence X-ray standing wavefield (NIXSW) absorption and surface-extended X-ray absorption fine structure (SEXAFS). NIXSW measurements show that the most likely site of adsorption is at the threefold "fcc" hollow, with some lateral disorder. The location of the S atoms at the "fcc" hollow site is consistent with S adsorption on the neighbouring fcc (111) transition metal surfaces. The coherent position relative to the Rh(111) lattice plane was measured to be 1.73 ± 0.05 Å. SEXAFS analysis revealed an S-Rh nearest neighbour bond distance of 2.25 ± 0.04 Å. The combined results of the NIXSW and SEXAFS measurements suggest that there is a net outward surface relaxation of the topmost Rh(111) layers of 0.1 ± 0.05 Å. © 1997 Elsevier Science B.V.
Original languageEnglish
Pages (from-to)254 - 261
Number of pages8
JournalSurface Science
Issue number1-3
Publication statusPublished - 23 Oct 1997
Externally publishedYes


All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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