We present the results of the study on the thermal conductivity of different thin film materials produced by conventional thermal evaporation. The main features of the thermal pulse method employed for the measurement of the thermal conductivity are described. Thermal conductivity can be measured by determining the traveling time of a thermal wave propagating through the film. A pump laser beam is directed onto a sample consisting of a thin transparent test layer and a totally absorbing substrate for the laser wavelength. As a consequence of the laser pulse, a temperature profile builds up at the substrate-film interface. A thermal pulse starts to diffuse from the substrate-film interface to the surface of the layer. Therefore, the temperature rise at the surface of the test layer starts with a time delay with respect to the laser pulse. The time delay depends on the propagation time of the thermal wave through the layer and is related to the thermal conductivity and the thickness of the layer. Measurements are evaluated by calculations based on the finite difference method. The results show that the analyzed thin films have lower thermal conductivity than the corresponding materials in bulk form.
|Pages (from-to)||71 - 76|
|Number of pages||6|
|Journal||Applied Physics A: Materials Science and Processing|
|Publication status||Published - Jul 2000|
All Science Journal Classification (ASJC) codes
- Materials Science(all)