The characterization of inhomogeneous thin film has been a widely studied topic. In the present work an inhomogeneous film model where the real part of the refractive index has a parabolic profile through the film thickness is supposed and a procedure for the unequivocal determination of the model parameters from normal incidence spectro-photometric measurements of T(lambda), R(lambda) and R'(lambda) is outlined. The parabolic model can be useful in the initial stage of investigation on a film material, which is suspected of being inhomogenous, as the model parameters, the gradient and curvature of the n parabolic profile, provide a quantitative evaluation of the film inhomogeneity even when the parabolic model is not realistic.
|Pages (from-to)||15 - 26|
|Number of pages||12|
|Journal||Pure and Applied Optics: Journal of the European Optical Society Part A|
|Publication status||Published - 1995|
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)
Montecchi, M., Masetti, E., & Emiliani, G. (1995). Thickness and model optimization in characterization of optical interference films by using discontinuities of n(lambda) solutions. Pure and Applied Optics: Journal of the European Optical Society Part A, 4(1), 15 - 26. . https://doi.org/10.1088/0963-9659/4/1/003