Thomson scattering measurements in the RFX reversed field pinch

M. Bassan, R. Bilato, L. Giudicotti, R. Pasqualotto, A. Sardella

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Abstract

The first systematic measurements of the electron temperature (Te) spatial profile have been obtained in the reversed field pinch experiment RFX with a single pulse Thomson scattering (TS) diagnostic. Scattered light from a ruby laser pulse (E≤15 J, Δt=30 ns) is collected through three objectives from 10 positions along a diameter in the plasma equatorial plane, with a spatial resolution of 2.5 cm. Plasma discharges with current in the range 700-900 kA have been investigated finding evidence of a quite flat Teprofile. Data dispersion significantly greater than experimental uncertainties provides an indication of remarkable plasma fluctuations. Results are in good agreement with Temeasurements from other single chord spectroscopic diagnostics (SiLi detector and SXR double filter), showing a reliable operation down to an electron density ne=3×1019m-3. Integration of this apparatus with a ND:YLF laser system for multipulse Thomson scattering measurements, sharing the same input optics, is under way. © 1997 American Institute of Physics.
Original languageEnglish
Pages (from-to)718 - 720
Number of pages3
JournalReview of Scientific Instruments
Volume68
Issue number1
DOIs
Publication statusPublished - 1997
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

Bassan, M., Bilato, R., Giudicotti, L., Pasqualotto, R., & Sardella, A. (1997). Thomson scattering measurements in the RFX reversed field pinch. Review of Scientific Instruments, 68(1), 718 - 720. https://doi.org/10.1063/1.1147762