Silicon nanoparticles have been produced by means of laser synthesis from silane gas. The average size and size distribution of the particle can be controlled by the synthesis parameters. To optimise the process, in order to reduce the particle size, a wide angle x-ray diffraction (WAXS) investigation method has been developed to rapidly and easily characterise the produced powder batches. The method is based on a Monte Carlo interference function (MIF) fitting of the experimental peaks. The results of the application of the MIF procedure on powder batches with different particle sizes are presented and compared with Brunauer-Emmett-Teller specific surface measurements and transmission electron microscopy.
|Pages (from-to)||37 - 42|
|Number of pages||6|
|Journal||Materials Science Forum|
|Publication status||Published - 1995|
All Science Journal Classification (ASJC) codes
- Materials Science(all)
Borsella, E., Botti, S., Cesile, M. C., Di Nunzio, P. E., Martelli, S., & Nesterenko, A. (1995). Wide angle x-ray diffraction (WAXS) characterisation of nanoscale silicon particles produced by laser synthesis from silane gas. Materials Science Forum, 195, 37 - 42.