X-ray beam monitor made by thin-film CVD single-crystal diamond

Marco Marinelli, E. Milani, G. Prestopino, C. Verona, G. Verona-Rinati, M. Angelone, M. Pillon, V. Kachkanov, N. Tartoni, M. Benetti, D. Cannat, F. Di Pietrantonio

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

A novel beam position monitor, operated at zero bias voltage, based on high-quality chemical-vapor-deposition single-crystal Schottky diamond for use under intense synchrotron X-ray beams was fabricated and tested. The total thickness of the diamond thin-film beam monitor is about 60 m. The diamond beam monitor was inserted in the B16 beamline of the Diamond Light Source synchrotron in Harwell (UK). The device was characterized under monochromatic high-flux X-ray beams from 6 to 20 keV and a micro-focused 10 keV beam with a spot size of approximately 2 μ 3 m square. Time response, linearity and position sensitivity were investigated. Device response uniformity was measured by a raster scan of the diamond surface with the micro-focused beam. Transmissivity and spectral responsivity versus beam energy were also measured, showing excellent performance of the new thin-film single-crystal diamond beam monitor. © 2012 International Union of Crystallography Printed in Singapore-all rights reserved.
Original languageEnglish
Pages (from-to)1015 - 1020
Number of pages6
JournalJournal of Synchrotron Radiation
Volume19
Issue number6
DOIs
Publication statusPublished - Nov 2012
Externally publishedYes

    Fingerprint

All Science Journal Classification (ASJC) codes

  • Radiation
  • Nuclear and High Energy Physics
  • Instrumentation

Cite this

Marinelli, M., Milani, E., Prestopino, G., Verona, C., Verona-Rinati, G., Angelone, M., ... Di Pietrantonio, F. (2012). X-ray beam monitor made by thin-film CVD single-crystal diamond. Journal of Synchrotron Radiation, 19(6), 1015 - 1020. https://doi.org/10.1107/S0909049512038186