The epitaxial growth of YBCO films both on (001) SrTiO3(STO) and Ni-W biaxially textured metallic substrates prepared by metal-organic deposition (MOD) using a trifluoroacetic acid (TFA) solution is reported. The degree of epitaxy of the YBCO films was investigated by X-ray diffraction and scanning electron microscopy (SEM). The as deposited films exhibit good morphological and structural properties. The ω-scan of the YBCO films grown on (001) SrTiO3single crystal substrate and on Pd/CeO2/YSZ/CeO2buffered biaxially textured Ni-5at%W (Ni-W) tapes has a full width at half maximum (FWHM) of 0.12° and 3.4°, respectively. The φ-scan of (113) peak of YBCO film grown on Ni-W substrate has FWHM of 6.1°. The YBCO/STO film has a zero resistance critical temperature of Tc(R0)92 K and a critical current density Jc > 2 MA/cm2at 77 K and in zero magnetic field. © 2006 IOP Publishing Ltd.
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)