A. Rufoloni, A. Augieri, G. Celentano, V. Galluzzi, A. Mancini, A. Vannozzi, T. Petrisor, L. Ciontea, V. Boffa, U. Gambardella

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The epitaxial growth of YBCO films both on (001) SrTiO3(STO) and Ni-W biaxially textured metallic substrates prepared by metal-organic deposition (MOD) using a trifluoroacetic acid (TFA) solution is reported. The degree of epitaxy of the YBCO films was investigated by X-ray diffraction and scanning electron microscopy (SEM). The as deposited films exhibit good morphological and structural properties. The ω-scan of the YBCO films grown on (001) SrTiO3single crystal substrate and on Pd/CeO2/YSZ/CeO2buffered biaxially textured Ni-5at%W (Ni-W) tapes has a full width at half maximum (FWHM) of 0.12° and 3.4°, respectively. The φ-scan of (113) peak of YBCO film grown on Ni-W substrate has FWHM of 6.1°. The YBCO/STO film has a zero resistance critical temperature of Tc(R0)92 K and a critical current density Jc > 2 MA/cm2at 77 K and in zero magnetic field. © 2006 IOP Publishing Ltd.
Original languageEnglish
Article number050
Pages (from-to)199 - 202
Number of pages4
JournalJournal of Physics: Conference Series
Issue number1
Publication statusPublished - 1 Jun 2006
Externally publishedYes


All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Rufoloni, A., Augieri, A., Celentano, G., Galluzzi, V., Mancini, A., Vannozzi, A., ... Gambardella, U. (2006). YBa. Journal of Physics: Conference Series, 43(1), 199 - 202. [050]. https://doi.org/10.1088/1742-6596/43/1/050