YBCO films and CeO

G. Celentano, V. Galluzzi, A. Mancini, A. Rufoloni, A. Vannozzi, A. Augieri, T. Petrisor, L. Ciontea, A. Tuissi, E. Villa, U. Gambardella

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Abstract

A CeO2/YSZ/CeO2buffer layer structure was epitaxially deposited by pulsed laser deposition on a Pd seed layer grown on non magnetic Ni88Cr8W4alloy. Structural analyzes performed by x-ray diffraction and EBSD show a good texture, with typical YBCO FWHM of about 5° and 8.5° for in-plane and out-of-plane orientations, respectively. About 300 nm YBCO films deposited by PLD on such a buffer layer structure, show typical values of critical temperature of about 89 K and a critical current density greater than 0.6 MA/cm2at 77 K and self field. © 2005 IEEE.
Original languageEnglish
Pages (from-to)2691 - 2694
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Volume15
Issue number2 PART III
DOIs
Publication statusPublished - Jun 2005
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

Celentano, G., Galluzzi, V., Mancini, A., Rufoloni, A., Vannozzi, A., Augieri, A., ... Gambardella, U. (2005). YBCO films and CeO. IEEE Transactions on Applied Superconductivity, 15(2 PART III), 2691 - 2694. https://doi.org/10.1109/TASC.2005.847784